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Rickey Denton Enterprises - Developing semi-automatic wafer inspection |
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| on Wednesday, November 01, 2006 - 09:29 PM ,
Admin wrote : |
We have been awarded a contract to develop an semi automatic third optical system with wafer mapping by one of our valued customers. After surveying the market, we determined that we could not satisfy our customers requirements with a purchased system, with the key wafer mapping feature they desired. While there are numerous fully automatic inspection systems, their seems to be a lack of equipment between fully automatic equipment, and just using an microscope and PC program to modify the wafer maps. To learn more read on!
Working with our customer to specify the equipment operational requirements, we will be delivering two semiautomatic inspection stations, with wafer mapping and updating of the wafer map, and optional ink dot on rejected parts.The high magnification optics will allow detailed inspection, with color camera to snap pictures of defects. The XYT table will pre-position the parts to be inspected, with operator controls to move around the inspection area.
For additional information, contact us by email at sales@semiequipment.com or just call our office at 972-423-2090. |
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