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RDE to deliver new inspection system |
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| on Thursday, December 13, 2007 - 02:34 AM ,
Admin wrote : |
Rickey Denton Enterprises has received a order to build a pick and place sorting system utilizing high magnification inspection on all six sides of small semiconductor devices for delivery in the first quarter of 2008.
This system is designed for inspection and sorting of devices, with the operator making the call on device defects. Handling of the pick and movement into the inspection area are semi-automatic, with the operator inspecting the device top surface before pick. The operator then inspects all sides and bottom of the device to classify the device for automatic placement on the output handler. Wafer maps are updated on the pick side, and created on the output side for defect classifications.
The machine fills a niche market between manual inspection with manual wafer map updates, and fully automatic inspection systems that cost up to a million dollars.
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